BOARD NO : 99
MOE-P-4 (625)+Mo-PA-151
Solution-processed OLEDs crosslinked via PIX: XSW Measurement of Sulfur Distribution inside the Polymer Layer
M. Brücher,1,* A. von Bohlen,1 R. Hergenröder1 , A. Köhnen,2 A. Reckmann,2 H. Klesper,2 K. Meerholz2
1 ISAS - Institute for Analytical Sciences, 44139 Dortmund, Germany
2 Chemistry Department, University of Cologne, 50939 Cologne, Germany
Student Presenter: MARTIN BRÜCHER

BOARD NO : 80
POL-P-10 (662)+Tu-PA-219
Characterization of Polystyrene and Sulfonated Polystyrene Thin Films Synthesized in a Dielectric Barrier Discharge
D. Merche1, C. Poleunis2, P. Bertrand2, F. Reniers1
1 Service de Chimie Analytique et Chimie des Interfaces, Department of Chemistry, Université Libre de Bruxelles, 1050 Brussels, Belgium
2 Unité de Physico-Chimie et de Physique des Matériaux, Université Catholique de Louvain, 1348 Louvain-la-Neuve, Belgium
Student Presenter: DELPHINE MERCHE

BOARD NO : 109
TEC-P-9 (92)+Th-PA-279
Charging/Discharging Dynamics of CdS and CdSe Films Under Photoillumination Using XPS
H. Sezen, S. Suzer
Chemistry Department, Bilkent University 06800 Ankara, Turkey
Student Presenter: HÝKMET SEZEN